SAE J2052 Test Device Head Contact Duration Analysis
作者:标准资料网 时间:2024-04-28 13:53:01 浏览:9958
来源:标准资料网
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Product Code:SAE J2052
Title:Test Device Head Contact Duration Analysis
Issuing Committee:Safety Test Instrumentation Stds Comm
Scope:This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
Title:Test Device Head Contact Duration Analysis
Issuing Committee:Safety Test Instrumentation Stds Comm
Scope:This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
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